Publikationen - 3D-Gefüge statisch

• F. Lasagni, A. Lasagni, M. Engstler, H.P. Degischer, F. Mücklich „Nano-characterization of Cast Structures by FIB-Tomography“ Advanced Engineering Materials, 10(2008), 1, 62-66
• F. Lasagni, A. Lasagni, E. Marks, C. Holzapfel, F. Mücklich, H.P. Degischer „Three Dimensional Characterization of ´As-cast´ and Solution-treated AlSi12(Sr) Alloys by High-resolution FIB Tomography“ Acta Materialia, 55(2007), 3875-3882
• F. Lasagni, A. Lasagni, C. Holzapfel, F. Mücklich, H.P. Degischer „Three Dinemsional Characterization of Unmodified and Sr-Modified Al-Si Eutectics by FIB and FIB EDX Tomography“ Advanced Engineering Materials, 8(2006), 8, 719-723
• A. Velichko, C. Holzapfel, A. Siefers, K. Schladitz, F. Mücklich  „Unambiguous classification of complex microstructures by its 3D parameters applied to graphite in cast iron“, Acta Materialia, (2008) in print
• A. Velichko, C. Holzapfel, F. Mücklich „3D Characterization of Graphite Morphologies in Cast Iron“ Advanced Engineering Materials, 9(2007), 1, 39-45
• N. Jeanvoine, C. Holzapfel, F. Soldera, F. Mücklich „3D-Investigations of Plasma Erosion Craters using FIB/SEM Dual-Beam Techniques“ Practical Metallography, 43(2006), 3, 107-119
• C. Holzapfel, W. Schäf, M. Marx, H. Vehoff, F. Mücklich „Interaction of Cracks with Precipitates and Grain Boundaries: Understanding Crack Growth Mechanisms through Focused Ion Beam Tomography“ Scripta Materialia, 56(2007), 697-700
• L. Holzer, F. Indutny, P. Gasser, B. Münch, M. Wegmann “Three dimensional analyis of porous BaTiO3 ceramics using FIB Nanotomography” Journal of Microscopy, 216(2004), 84-95
• B.J. Inkson, M. Mulvihill, G. Möbius “3D determination of grain shape in a FeAl-based nanocomposite by 3D FIB tomography”Scripta Materialia, 45(2001), 753-758
• J. Konrad, S. Zaefferer, D. Raabe „Investigation of orientation gradients around a hard Laves particle in a warm-rolled Fe3Al-based alloy using a 3D EBSD FIB technique” Acta Materialia, 54(2006), 1369-1380
• M. Schaffer, J. Wagner, H. Schröttner, M. Schmied „Automated X-Ray Elemental Analysis in Three Dimensions Using a Dual Beam – Focused Ion Beam System“ Practical Metallography, 44(2007), 248-250
• L.A. Gianuzzi, F.A. Stevie “Introduction to Focused Ion Beam Technology” Springer 2005
• L. Holzer, B. Münch, M. Wegmann, P. Gasser „FIB Nanotomography of particulate Systems – Part I: Particle Shape and Topology of Interfaces“ Journal of the American Ceramic Society, 89(2006), 8, 2577-2585
• B. Münch, P. Gasser, L. Holzer „FIB Nanotomography of particulate Systems – Part II: Particle Recognition and Effect of Boundary Truncation“ Journal of the American Ceramic Society, 89(2006), 8, 2586-2595